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Acta Photonica Sinica  2017, Vol. 46 Issue (8): 0811003    DOI: 10.3788/gzxb20174608.0811003
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X-ray Backlighting Imaging Bragg Spectrometer for X-ray Diagnosis
LIU Li-feng1, XIAO Sha-li2, QIAN Jia-yu2
1. School of Physics and Electronics Science, Shanxi Datong University, Shanxi Datong 037009, China;
2. Key Laboratory of Optoelectronic Technology and System, Ministry of Education, Chongqing University, Chongqing 400030, China

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